JPH0151127B2 - - Google Patents

Info

Publication number
JPH0151127B2
JPH0151127B2 JP3664182A JP3664182A JPH0151127B2 JP H0151127 B2 JPH0151127 B2 JP H0151127B2 JP 3664182 A JP3664182 A JP 3664182A JP 3664182 A JP3664182 A JP 3664182A JP H0151127 B2 JPH0151127 B2 JP H0151127B2
Authority
JP
Japan
Prior art keywords
elements
recording medium
magnetic recording
displacement
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3664182A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58154613A (ja
Inventor
Shigekazu Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Precision Corp
Original Assignee
Nidec Copal Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Copal Corp filed Critical Nidec Copal Corp
Priority to JP3664182A priority Critical patent/JPS58154613A/ja
Priority to US06/473,250 priority patent/US4616281A/en
Priority to DE3308404A priority patent/DE3308404C2/de
Publication of JPS58154613A publication Critical patent/JPS58154613A/ja
Publication of JPH0151127B2 publication Critical patent/JPH0151127B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP3664182A 1982-03-10 1982-03-10 変位量検出装置 Granted JPS58154613A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP3664182A JPS58154613A (ja) 1982-03-10 1982-03-10 変位量検出装置
US06/473,250 US4616281A (en) 1982-03-10 1983-03-08 Displacement detecting apparatus comprising magnetoresistive elements
DE3308404A DE3308404C2 (de) 1982-03-10 1983-03-09 Vorrichtung zur Messung einer Relativverschiebung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3664182A JPS58154613A (ja) 1982-03-10 1982-03-10 変位量検出装置

Publications (2)

Publication Number Publication Date
JPS58154613A JPS58154613A (ja) 1983-09-14
JPH0151127B2 true JPH0151127B2 (en]) 1989-11-01

Family

ID=12475466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3664182A Granted JPS58154613A (ja) 1982-03-10 1982-03-10 変位量検出装置

Country Status (1)

Country Link
JP (1) JPS58154613A (en])

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60232018A (ja) * 1984-05-02 1985-11-18 松山株式会社 掘取機
DE3788831T2 (de) * 1986-07-29 1994-08-11 Nippon Denso Co Kontaktloses Potentiometer.
US7259553B2 (en) * 2005-04-13 2007-08-21 Sri International System and method of magnetically sensing position of a moving component
JP2008101932A (ja) * 2006-10-17 2008-05-01 Tokai Rika Co Ltd 磁気式位置検出装置
JP4921327B2 (ja) * 2007-11-27 2012-04-25 シーケーディ株式会社 磁気リニア測定装置
CN103499270B (zh) * 2013-09-29 2016-01-20 北京理工大学 一种自由活塞内燃发电机的活塞位置检测处理方法
JP6472175B2 (ja) * 2014-06-09 2019-02-20 Dmg森精機株式会社 位置検出装置
DE102017129346A1 (de) * 2016-12-13 2018-06-14 Infineon Technologies Ag Magnetsensorschaltungen und -systeme und Verfahren zum Bilden von Magnetsensorschaltungen
WO2022131049A1 (ja) * 2020-12-18 2022-06-23 パナソニックＩｐマネジメント株式会社 磁気検知システム、位置検知システム及び磁気検知モジュール

Also Published As

Publication number Publication date
JPS58154613A (ja) 1983-09-14

Similar Documents

Publication Publication Date Title
JPH0252807B2 (en])
US5357388A (en) Shorted dual element magnetoresistive reproduce head exhibiting high density signal amplification
US7112957B2 (en) GMR sensor with flux concentrators
US6107793A (en) Magnetic sensing device unaffected by positioning error of magnetic field sensing elements
US6169396B1 (en) Sensing device for detecting change in an applied magnetic field achieving high accuracy by improved configuration
CA1136240A (en) Magnetic rotary encoder for detection of absolute values of angular displacement
US4506220A (en) Temperature compensated magnetoresistive effect thin film magnetic sensor
JP3367230B2 (ja) 位置検出装置
US20100001723A1 (en) Bridge type sensor with tunable characteristic
JP3487452B2 (ja) 磁気検出装置
JPH11304413A (ja) 磁気検出装置
JPH0151127B2 (en])
JPS58154612A (ja) 変位量検出装置
US6246234B1 (en) Magnetic detector with improved temperature characteristic and noise resistance
JPS61173101A (ja) 位置センサ
JPH0448175B2 (en])
JPH06275887A (ja) 磁気抵抗素子
JP4237855B2 (ja) 磁界センサ
JPS58154680A (ja) 磁気センサ
JP2929714B2 (ja) 角度検出装置
JPH0432969B2 (en])
KR100323906B1 (ko) 자기검출장치_
JPS5853722B2 (ja) 磁気ヘッド
JPH0618279A (ja) 位置検出装置
JPH0868661A (ja) 位置検出装置